Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy
نویسندگان
چکیده
Multi-frequency scanning near-field optical microscopy, based on a quartz tuning fork-probe (QTF-p) sensor using the first two orders of in-plane bending symmetrical vibration modes, has recently been developed. This method can simultaneously achieve positional feedback (based on the 1st in-plane mode called the low mode) and detect near-field optically induced forces (based on the 2nd in-plane mode called the high mode). Particularly, the high mode sensing performance of the QTF-p is an important issue for characterizing the tip-sample interactions and achieving higher resolution microscopic imaging but the related researches are insufficient. Here, we investigate the vibration performance of QTF-p at high mode based on the experiment and finite element method. The frequency spectrum characteristics are obtained by our homemade laser Doppler vibrometer system. The effects of the properties of the connecting glue layer and the probe features on the dynamic response of the QTF-p sensor at the high mode are investigated for optimization design. Finally, compared with the low mode, an obvious improvement of quality factor, of almost 50%, is obtained at the high mode. Meanwhile, the QTF-p sensor has a high force sensing sensitivity and a large sensing range at the high mode, indicating a broad application prospect for force sensing.
منابع مشابه
Introduction to the quartz tuning fork
We discuss various aspects of the quartz tuning fork, ranging from its original purpose as a high quality factor resonator for use as a stable frequency reference, to more exotic applications in sensing and scanning probe microscopy. We show experimentally how to tune the quality factor by injecting energy in phase with the current at resonance quality factor increase or out of phase quality fa...
متن کاملCalibrating a tuning fork for use as a scanning probe microscope force sensor.
Quartz tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface inte...
متن کاملInterface circuits for quartz crystal sensors in scanning probe microscopy applications
Complementary to industrial cantilever based force sensors in scanning probe microscopy SPM , symmetrical quartz crystal resonators QCRs , e.g., tuning fork, trident tuning fork, and needle quartz sensors, are of great interest. A self-excitation scheme with QCR is particularly promising and allows the development of cheap SPM heads with excellent characteristics. We have developed a high perfo...
متن کاملMeasuring the interaction force between a tip and a substrate using a quartz tuning fork under ambient conditions.
Tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction...
متن کاملImproving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End
The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork senso...
متن کامل